A new maximal diagnosis algorithm for interconnect test.
Interconnect test for highly integrated environments becomes more important in terms of its test time and a complete diagnosis, as the complexity of the circuit increases. Since the board-level interconnect test is based on boundary scan technology, it takes a long test time to apply test vectors se...
| প্রকাশিত: | IEEE Transactions on VLSI systems 12, 5 (2004). |
|---|---|
| প্রধান লেখক: | |
| বিন্যাস: | প্রবন্ধ |
| ভাষা: | ইংরেজি |
| বিষয়গুলি: |