A new maximal diagnosis algorithm for interconnect test.
Interconnect test for highly integrated environments becomes more important in terms of its test time and a complete diagnosis, as the complexity of the circuit increases. Since the board-level interconnect test is based on boundary scan technology, it takes a long test time to apply test vectors se...
| Publicat a: | IEEE Transactions on VLSI systems 12, 5 (2004). |
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| Autor principal: | |
| Format: | Article |
| Idioma: | English |
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