A new maximal diagnosis algorithm for interconnect test.

Interconnect test for highly integrated environments becomes more important in terms of its test time and a complete diagnosis, as the complexity of the circuit increases. Since the board-level interconnect test is based on boundary scan technology, it takes a long test time to apply test vectors se...

詳細記述

書誌詳細

出版年:	IEEE Transactions on VLSI systems 12, 5 (2004).
第一著者:	Yongjoon Kim
フォーマット:	論文
言語:	English
主題:	Board-level test. Boundary scan technology. Circuit complexity. Diagnosis algorithm. Fault diagnosis. Interconnect test.