Test data compression technique for embedded cores using virtual scan chains.
This paper presents a design-for-test (DFT) technique to implement a "virtual scan chain" in a core that looks (to the system integrator) like it is shorter than the real scan chain inside the core. A core with a "virtual scan chain" is fully compatible with a core with a regular...
| প্রকাশিত: | IEEE Transactions on VLSI systems 12, 7 (2004). |
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| প্রধান লেখক: | |
| বিন্যাস: | প্রবন্ধ |
| ভাষা: | English |
| বিষয়গুলি: |