Double sampling data checking technique an online testing solution for multisource noise-induced errors on on-chip interconnects and buses.
With processors and system-on-chips using nano-meter technologies, several design and test efforts have been recently developed to eliminate and test for many emerging DSM noise effects. In this paper, we show the emergence of multisource noise effects, where multiple DSM noise sources combine to pr...
| הוצא לאור ב: | IEEE Transactions on VLSI systems 12, 7 (2004). |
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| מחבר ראשי: | |
| פורמט: | Article |
| שפה: | English |
| נושאים: |