Fault isolation for nonisolated blocks.
We consider circuits represented as interconnections of logic blocks. In such circuits, the goal of fault isolation is to identify which one of the blocks is faulty based on a faulty output response produced by the circuit. We study this issue and demonstrate that perfect or close-to-perfect fault i...
| 出版年: | IEEE Transactions on VLSI systems 12, 12 (2004). |
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| 第一著者: | |
| フォーマット: | 論文 |
| 言語: | English |
| 主題: |