Online BIST and BIST-based diagnosis of FPGA logic blocks.

We present the first online built-in self-test (BIST) and BIST-based diagnosis of programmable logic resources in field-programmable gate arrays (FPGAs). These techniques were implemented and used in a roving self-testing areas (STARs) approach to testing and reconfiguration of FPGAs for fault-toler...

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में प्रकाशित:	IEEE Transactions on VLSI systems 12, 12 (2004).
मुख्य लेखक:	Abramovici, M.
स्वरूप:	लेख
भाषा:	अंग्रेज़ी
विषय:	BIST based diagnosis. FPGA logic blocks. Defective modules. Fault tolerance. Faulty lookup table. Field programmable gate arrays. Flip flop. Online BIST. Online built in self test. Programmable logic blocks. Programmable logic resources. Roving self testing areas.