Weighted pseudorandom hybrid BIST.

Weighted pseudorandom hybrid BIST.

This paper presents a new test data-compression scheme that is a hybrid approach between external testing and built-in self-test (BIST). The proposed approach is based on weighted pseudorandom testing and uses a novel approach for compressing and storing the weight sets. Three levels of compression...

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Chi tiết về thư mục
Xuất bản năm:IEEE Transactions on VLSI systems 12, 12 (2004).
Tác giả chính: Jas, A.
Định dạng: Bài viết
Ngôn ngữ:English
Những chủ đề:
Built in self test.
External testing.
Fault coverage.
Function logic.
Hybrid BIST architecture.
Hybrid method.
Test cost reduction.
Test data compression.
Tester bandwidth requirements.
Tester storage requirements.
Weight set compression.
Weight set storage.
Weighted pseudorandom testing.