Analytical test buffer design for differential signaling I

Analytical test buffer design for differential signaling I

This paper presents a novel input test buffer design methodology that is used for testing the differential signaling interconnects. The input test buffer is aimed to detect hardware failures in differential electrical connections. The input test buffer can also be used to check the differential sign...

पूर्ण विवरण

ग्रंथसूची विवरण
में प्रकाशित:IEEE Transactions on VLSI systems 13, 3 (2005).
मुख्य लेखक: Sanghyeon Baeg
स्वरूप: लेख
भाषा:English
विषय:
0.13 micron.
I/O technology.
Spice based fault simulation.
Analog detector.
Catastrophic defects.
Current mode logic.
Differential electrical connections.
Differential signaling I/O buffers.
Differential signaling interconnects.
Digital engines.
Error syndrome analysis.
Fault detection.
Fault syndromes.
Hardware failure detection.
Input test buffer design.