A novel wavelet transform-based transient current analysis for fault detection and localization.

Transient current (IDD) testing has been often cited and investigated as an alternative and/or supplement to quiescent current (IDDQ) testing. In this correspondence, we present a novel integrated method for fault detection and localization using wavelet transform-based IDD waveform analysis. The ti...

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Опубликовано в::	IEEE Transactions on VLSI systems 13, 4 (2005).
Главный автор:	Bhunia, S.
Формат:	Статья
Язык:	English
Предметы:	Complex power supply network. Digital CMOS circuits. Fault detection. Fault localization. Measurement noise. Process variation. Quiescent current testing. Shift register. Time-frequency resolution property. Transient current analysis. Transient current testing. Waveform analysis. Wavelet transform. Wavelet-based detection.