A novel wavelet transform-based transient current analysis for fault detection and localization.

A novel wavelet transform-based transient current analysis for fault detection and localization.

Transient current (IDD) testing has been often cited and investigated as an alternative and/or supplement to quiescent current (IDDQ) testing. In this correspondence, we present a novel integrated method for fault detection and localization using wavelet transform-based IDD waveform analysis. The ti...

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Bibliographic Details
Published in:IEEE Transactions on VLSI systems 13, 4 (2005).
Main Author: Bhunia, S.
Format: Article
Language:English
Subjects:
Complex power supply network.
Digital CMOS circuits.
Fault detection.
Fault localization.
Measurement noise.
Process variation.
Quiescent current testing.
Shift register.
Time-frequency resolution property.
Transient current analysis.
Transient current testing.
Waveform analysis.
Wavelet transform.
Wavelet-based detection.