Cita APA (7th ed.)

Michael, M. Function-based compact test pattern generation for path delay faults. IEEE Transactions on VLSI systems.

Cita Chicago (17th ed.)

Michael, M.K. "Function-based Compact Test Pattern Generation for Path Delay Faults." IEEE Transactions on VLSI Systems .

Cita MLA (9th ed.)

Michael, M.K. "Function-based Compact Test Pattern Generation for Path Delay Faults." IEEE Transactions on VLSI Systems, .