Michael, M. Function-based compact test pattern generation for path delay faults. IEEE Transactions on VLSI systems.
Chicago Style (17. basım) AtıfMichael, M.K. "Function-based Compact Test Pattern Generation for Path Delay Faults." IEEE Transactions on VLSI Systems .
MLA (9th ed.) AtıfMichael, M.K. "Function-based Compact Test Pattern Generation for Path Delay Faults." IEEE Transactions on VLSI Systems, .
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