APA (7. basım) Alıntı

Michael, M. Function-based compact test pattern generation for path delay faults. IEEE Transactions on VLSI systems.

Chicago Style (17. basım) Atıf

Michael, M.K. "Function-based Compact Test Pattern Generation for Path Delay Faults." IEEE Transactions on VLSI Systems .

MLA (9th ed.) Atıf

Michael, M.K. "Function-based Compact Test Pattern Generation for Path Delay Faults." IEEE Transactions on VLSI Systems, .