Design and analysis of compact dictionaries for diagnosis in scan-BIST.
We present a new technique for generating compact dictionaries for cause-effect diagnosis in scan-BIST. This approach relies on the use of three compact dictionaries and target both modeled and unmodeled faults. We present analytical results that provide useful guidelines for the design of these com...
| 發表在: | IEEE Transactions on VLSI systems 13, 8 (2005). |
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| 格式: | Article |
| 語言: | English |
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