Design and analysis of compact dictionaries for diagnosis in scan-BIST.

Design and analysis of compact dictionaries for diagnosis in scan-BIST.

We present a new technique for generating compact dictionaries for cause-effect diagnosis in scan-BIST. This approach relies on the use of three compact dictionaries and target both modeled and unmodeled faults. We present analytical results that provide useful guidelines for the design of these com...

Täydet tiedot

Bibliografiset tiedot
Julkaisussa:IEEE Transactions on VLSI systems 13, 8 (2005).
Päätekijä: Chunsheng Liu
Aineistotyyppi: Artikkeli
Kieli:English
Aiheet:
ISCAS-89 benchmark circuit.
LFSR.
Cause-effect diagnosis.
Compact dictionary.
Diagnostic resolution.
Fault diagnosis.
Interval-based dictionary.
Linear feedback shift register.
Scan-BIST.