Chunsheng Liu. Design and analysis of compact dictionaries for diagnosis in scan-BIST. IEEE Transactions on VLSI systems.
Dyfyniad Arddull ChicagoChunsheng Liu. "Design and Analysis of Compact Dictionaries for Diagnosis in Scan-BIST." IEEE Transactions on VLSI Systems .
Dyfyniad MLAChunsheng Liu. "Design and Analysis of Compact Dictionaries for Diagnosis in Scan-BIST." IEEE Transactions on VLSI Systems, .
Rhybudd: Mae'n bosib nad yw'r dyfyniadau hyn bob amser yn 100% cywir.