Autoscan a scan design without external scan inputs or outputs.

We propose a design-for-testability technique for synchronous sequential circuits called autoscan. Autoscan uses scan chains similar to conventional scan. However, it gives up the external scan inputs and outputs in order to eliminate the test data volume associated with them. Scan operations under...

詳細記述

書誌詳細

出版年:	IEEE Transactions on VLSI systems 13, 9 (2005).
第一著者:	Pomeranz, I.
フォーマット:	論文
言語:	English
主題:	Autoscan. Design for testability technique. Fault diagnosis. Scan design. Synchronous sequential circuits. Test generation procedure.