Autoscan a scan design without external scan inputs or outputs.
We propose a design-for-testability technique for synchronous sequential circuits called autoscan. Autoscan uses scan chains similar to conventional scan. However, it gives up the external scan inputs and outputs in order to eliminate the test data volume associated with them. Scan operations under...
| הוצא לאור ב: | IEEE Transactions on VLSI systems 13, 9 (2005). |
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| מחבר ראשי: | |
| פורמט: | Article |
| שפה: | English |
| נושאים: |