Autoscan a scan design without external scan inputs or outputs.

Autoscan a scan design without external scan inputs or outputs.

We propose a design-for-testability technique for synchronous sequential circuits called autoscan. Autoscan uses scan chains similar to conventional scan. However, it gives up the external scan inputs and outputs in order to eliminate the test data volume associated with them. Scan operations under...

Szczegółowa specyfikacja

Opis bibliograficzny
Wydane w:IEEE Transactions on VLSI systems 13, 9 (2005).
1. autor: Pomeranz, I.
Format: Artykuł
Język:English
Hasła przedmiotowe:
Autoscan.
Design for testability technique.
Fault diagnosis.
Scan design.
Synchronous sequential circuits.
Test generation procedure.