Microarchitecture-level leakage reduction with data retention.

In this paper, we study microarchitecture-level leakage energy reduction by power gating. We consider the virtual power/ground rails clamp (VRC) and multithreshold CMOS (MTCMOS) techniques and apply VRC to memory-based units for data retention and MTCMOS to the other units. We propose a systematic m...

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Vydáno v:IEEE Transactions on VLSI systems 13, 11 (2005).
Hlavní autor: Weiping Liao
Médium: Článek
Jazyk:English
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