Microarchitecture-level leakage reduction with data retention.
In this paper, we study microarchitecture-level leakage energy reduction by power gating. We consider the virtual power/ground rails clamp (VRC) and multithreshold CMOS (MTCMOS) techniques and apply VRC to memory-based units for data retention and MTCMOS to the other units. We propose a systematic m...
| Τόπος έκδοσης: | IEEE Transactions on VLSI systems 13, 11 (2005). |
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| Κύριος συγγραφέας: | |
| Μορφή: | Άρθρο |
| Γλώσσα: | English |
| Θέματα: |