Petri-net and GA-based approach to modeling, scheduling, and performance evaluation for wafer fabrication.
A genetic algorithm (GA) embedded search strategy over a colored timed Petri net (CTPN) for wafer fabrication is proposed. Through the CTPN model, all possible behaviors of the wafer manufacturing systems, such as WIP status and machine status, can be completely tracked down by the reachability grap...
| الحاوية / القاعدة: | IEEE Transactions on robotics and automation 17, 5 (2001). |
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| المؤلف الرئيسي: | |
| التنسيق: | مقال |
| اللغة: | الإنجليزية |
| الموضوعات: |