Characterization in silicon processing

Characterization in silicon processing

Show all versions (2)
Manylion Llyfryddiaeth
Awduron Eraill: Strausser, Yale, Brundle, C. Richard, Evans, Charles A.
Fformat: Llyfr
Iaith:English
Cyhoeddwyd: New York Momentum Press c2010.
Pynciau:
Silicon.
Electric conductors.
Semiconductor films.
Surface chemistry.