Hynecek, J. Excess noise and other important characteristics of low light level imaging using charge multiplying CCDs. IEEE Transactions on electron devices.
Chicago-referens (17:e uppl.)Hynecek, J. "Excess Noise and Other Important Characteristics of Low Light Level Imaging Using Charge Multiplying CCDs." IEEE Transactions on Electron Devices .
MLA-referens (9:e uppl.)Hynecek, J. "Excess Noise and Other Important Characteristics of Low Light Level Imaging Using Charge Multiplying CCDs." IEEE Transactions on Electron Devices, .
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