Hynecek, J. Excess noise and other important characteristics of low light level imaging using charge multiplying CCDs. IEEE Transactions on electron devices.
Chicagoスタイル(17版)引用形式Hynecek, J. "Excess Noise and Other Important Characteristics of Low Light Level Imaging Using Charge Multiplying CCDs." IEEE Transactions on Electron Devices .
MLA(9版)引用形式Hynecek, J. "Excess Noise and Other Important Characteristics of Low Light Level Imaging Using Charge Multiplying CCDs." IEEE Transactions on Electron Devices, .
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