Hynecek, J. Excess noise and other important characteristics of low light level imaging using charge multiplying CCDs. IEEE Transactions on electron devices.
Chicago Style (17th ed.) CitationHynecek, J. "Excess Noise and Other Important Characteristics of Low Light Level Imaging Using Charge Multiplying CCDs." IEEE Transactions on Electron Devices .
MLA (9th ed.) CitationHynecek, J. "Excess Noise and Other Important Characteristics of Low Light Level Imaging Using Charge Multiplying CCDs." IEEE Transactions on Electron Devices, .
Warning: These citations may not always be 100% accurate.