Excess noise and other important characteristics of low light level imaging using charge multiplying CCDs.

Excess noise and other important characteristics of low light level imaging using charge multiplying CCDs.

This paper describes recent progress in technology of low light level image sensing using CCD sensors that multiply charge by impact ionization before its conversion into a voltage. The paper presents a brief description of the concept, the outline of a typical sensor design with some important deta...

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Bibliographic Details
Published in:IEEE Transactions on electron devices 50, 1 (2003).
Main Author: Hynecek, J.
Format: Article
Language:English
Subjects:
CCD sensors.
Avalanche multiplication.
Charge multiplying CCDs.
Excess noise.
Excess noise factor formula.
High dynamic range.
Image intensifiers.
Impact ionization.
Low light level imaging.
Noise components.
Output signal probability distribution function.
Sensor design.
Serial register blooming prevention.
Single photon detection performance.