Nitride-based light emitting diodes with Si-doped In0.23Ga0.77N

Nitride-based light emitting diodes with Si-doped In0.23Ga0.77N

The electrical properties of Si-doped n+-In0.23Ga0.77N/GaN SPS structure were investigated and compared with conventional Mg-doped GaN contact layer. Temperature dependent Hall measurement showed that such a SPS structure exhibits a high sheet electron concentration. It was found that we could reduc...

Celý popis

Podrobná bibliografie
Vydáno v:IEEE Transactions on electron devices 50, 2 (2003).
Hlavní autor: Kuo, C.H
Médium: Článek
Jazyk:English
Témata:
10 ohm.
2.94 V.
20 mA.
LED forward voltage.
SPS.
Lifetime.
Light emitting diodes.
Series resistance.
Sheet electron concentration.
Short period superlattice.
Temperature dependent Hall measurement.
Tunneling contact layer.
In0.23Ga0.77N:Si-GaN.
In0.23Ga0.77N:Si/GaN.