APA (7th ed.) Citation

Yo-Sheng Lin. An analysis of small-signal gate-drain resistance effect on RF power MOSFETs. IEEE Transactions on electron devices.

Chicago Style (17th ed.) Citation

Yo-Sheng Lin. "An Analysis of Small-signal Gate-drain Resistance Effect on RF Power MOSFETs." IEEE Transactions on Electron Devices .

MLA (9th ed.) Citation

Yo-Sheng Lin. "An Analysis of Small-signal Gate-drain Resistance Effect on RF Power MOSFETs." IEEE Transactions on Electron Devices, .

Warning: These citations may not always be 100% accurate.