Baksht, T. Impact ionization measurements and modeling for power PHEMT. IEEE Transactions on electron devices.
शिकागो शैली (17वां संस्करण) प्रशस्ति पत्रBaksht, T. "Impact Ionization Measurements and Modeling for Power PHEMT." IEEE Transactions on Electron Devices .
एमएलए (9वां संस्करण) प्रशस्ति पत्रBaksht, T. "Impact Ionization Measurements and Modeling for Power PHEMT." IEEE Transactions on Electron Devices, .
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