Baksht, T. Impact ionization measurements and modeling for power PHEMT. IEEE Transactions on electron devices.
Citación estilo ChicagoBaksht, T. "Impact Ionization Measurements and Modeling for Power PHEMT." IEEE Transactions on Electron Devices .
Cita MLABaksht, T. "Impact Ionization Measurements and Modeling for Power PHEMT." IEEE Transactions on Electron Devices, .
Warning: These citations may not always be 100% accurate.