Baksht, T. Impact ionization measurements and modeling for power PHEMT. IEEE Transactions on electron devices.
Lua i Stíl Chicago (17ú heag.)Baksht, T. "Impact Ionization Measurements and Modeling for Power PHEMT." IEEE Transactions on Electron Devices .
Lua MLA (9ú heag.)Baksht, T. "Impact Ionization Measurements and Modeling for Power PHEMT." IEEE Transactions on Electron Devices, .
Rabhadh: Seans nach mbeach na luanna seo go hiomlán cruinn i ngach uile chás.