Dyfyniad APA

Baksht, T. Impact ionization measurements and modeling for power PHEMT. IEEE Transactions on electron devices.

Dyfyniad Arddull Chicago

Baksht, T. "Impact Ionization Measurements and Modeling for Power PHEMT." IEEE Transactions on Electron Devices .

Dyfyniad MLA

Baksht, T. "Impact Ionization Measurements and Modeling for Power PHEMT." IEEE Transactions on Electron Devices, .

Rhybudd: Mae'n bosib nad yw'r dyfyniadau hyn bob amser yn 100% cywir.