Ikeda, S. Threshold voltage-related soft error degradation in a TFT SRAM cell. IEEE Transactions on electron devices.
芝加哥风格引文Ikeda, S. "Threshold Voltage-related Soft Error Degradation in a TFT SRAM Cell." IEEE Transactions on Electron Devices .
MLA引文Ikeda, S. "Threshold Voltage-related Soft Error Degradation in a TFT SRAM Cell." IEEE Transactions on Electron Devices, .
警告：这些引文格式不一定是100％准确.