APA (7th ed.) Citation

Ikeda, S. Threshold voltage-related soft error degradation in a TFT SRAM cell. IEEE Transactions on electron devices.

Chicago Style (17th ed.) Citation

Ikeda, S. "Threshold Voltage-related Soft Error Degradation in a TFT SRAM Cell." IEEE Transactions on Electron Devices .

MLA (9th ed.) Citation

Ikeda, S. "Threshold Voltage-related Soft Error Degradation in a TFT SRAM Cell." IEEE Transactions on Electron Devices, .

Warning: These citations may not always be 100% accurate.