Path delay fault diagnosis and coverage-a metric and an estimation technique.

Published research on path delay fault (PDF) testing has largely focused on the PDF classification and test-vector generation problems. Little attention has been paid to the diagnosis of delay faults and in defining realistic metrics for delay-fault coverage, We present a statistical diagnosis frame...

Полное описание

Библиографические подробности

Опубликовано в::	IEEE Transactions on computer-aided design of integrated circuits and systems 20, 3 (2001).
Главный автор:	Sivaraman, M.
Формат:	Статья
Язык:	English
Предметы:	ISCAS'89 benchmark circuits. Chip failure. Circuit failure. Computationally viable scheme. Delay-fault coverage. Diagnosability. Distributed fabrication-process perturbations. Distributed fabrication-process variations. Estimation technique. Path delay fault diagnosis. Statistical diagnosis framework.