Testing of core-based systems-on-a-chip.

Testing of core-based systems-on-a-chip.

Available techniques for testing of core-based systems-on-a-chip (SOCs) do not provide a systematic means for synthesizing low-overhead test architectures and compact test solutions. In this paper, we provide a comprehensive framework that generates low-overhead compact test solutions for SOCs. Firs...

সম্পূর্ণ বিবরণ

গ্রন্থ-পঞ্জীর বিবরন
প্রকাশিত:IEEE Transactions on computer-aided design of integrated circuits and systems 20, 3 (2001).
প্রধান লেখক: Ravi, S.
বিন্যাস: প্রবন্ধ
ভাষা:English
বিষয়গুলি:
Core access.
Core-based systems-on-a-chip.
Finite-state automata.
Hardware additions.
Hardware behavior.
Low-overhead test architectures.
Register-transfer level circuit.
Satisfiability-based solution.
Symbolic test.
System-level average area overhead.
Test application time reduction.
Testability analysis.
Transparency modes.