Ghosh, I. Automatic test pattern generation for functional register-transfer level circuits using assignment decision diagrams. IEEE Transactions on computer-aided design of integrated circuits and systems.
Chicago Style (17th ed.) CitationGhosh, I. "Automatic Test Pattern Generation for Functional Register-transfer Level Circuits Using Assignment Decision Diagrams." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems .
MLA (9th ed.) CitationGhosh, I. "Automatic Test Pattern Generation for Functional Register-transfer Level Circuits Using Assignment Decision Diagrams." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems, .
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