Ghosh, I. Automatic test pattern generation for functional register-transfer level circuits using assignment decision diagrams. IEEE Transactions on computer-aided design of integrated circuits and systems.
Citazione stile Chigago Style (17a edizione)Ghosh, I. "Automatic Test Pattern Generation for Functional Register-transfer Level Circuits Using Assignment Decision Diagrams." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems .
Citatione MLA (9a ed.)Ghosh, I. "Automatic Test Pattern Generation for Functional Register-transfer Level Circuits Using Assignment Decision Diagrams." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems, .
Attenzione: Queste citazioni potrebbero non essere precise al 100%.