Ghosh, I. Automatic test pattern generation for functional register-transfer level circuits using assignment decision diagrams. IEEE Transactions on computer-aided design of integrated circuits and systems.
Citación estilo ChicagoGhosh, I. "Automatic Test Pattern Generation for Functional Register-transfer Level Circuits Using Assignment Decision Diagrams." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems .
Cita MLAGhosh, I. "Automatic Test Pattern Generation for Functional Register-transfer Level Circuits Using Assignment Decision Diagrams." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems, .
Warning: These citations may not always be 100% accurate.