Software-based self-testing methodology for processor cores.

At-speed testing of gigahertz processors using external testers may not be technically and economically feasible. Hence, there is an emerging need for low-cost high-quality self-test methodologies that can be used by processors to test themselves at-speed. Currently, built-in self-test (BIST) is the...

Szczegółowa specyfikacja

Opis bibliograficzny

Wydane w:	IEEE Transactions on computer-aided design of integrated circuits and systems 20, 3 (2001).
1. autor:	Li Chen
Format:	Artykuł
Język:	angielski
Hasła przedmiotowe:	BIST. At-speed test. At-speed testing. Complex logic designs. Cost/fault coverage benefits. Gigahertz processors. Logic-BIST tool. Processor cores. Self-test methodologies. Self-test signatures. Software-based self-testing methodology. Structural tests. Test application. Test generation.