Handling the pin overhead problem of DFTs for high-quality and at-speed tests.
The pin overhead problem of nonscan design for testability (DFT) and built-in self-test design has been an unsolved problem for a long time. A new algorithm is proposed to connect extra pins of control test points with primary inputs. An economical test point structure is introduced, in which only o...
| الحاوية / القاعدة: | IEEE Transactions on computer-aided design of integrated circuits and systems 21, 9 (2002). |
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| المؤلف الرئيسي: | |
| التنسيق: | مقال |
| اللغة: | English |
| الموضوعات: |