Handling the pin overhead problem of DFTs for high-quality and at-speed tests.

Handling the pin overhead problem of DFTs for high-quality and at-speed tests.

The pin overhead problem of nonscan design for testability (DFT) and built-in self-test design has been an unsolved problem for a long time. A new algorithm is proposed to connect extra pins of control test points with primary inputs. An economical test point structure is introduced, in which only o...

詳細記述

書誌詳細
出版年:IEEE Transactions on computer-aided design of integrated circuits and systems 21, 9 (2002).
第一著者: Dong Xiang
フォーマット: 論文
言語:English
主題:
ATPG.
BIST design.
Built-in self-test design.
Control test points.
Delay overhead.
Economical test point structure.
Inversion parity.
Nonscan DFT.
Nonscan design for testability.
Pin overhead problem.
Primary inputs.
Reconvergent fanouts.
Sequential depth for testability.