Παραπομπή σε μορφή APA (7η εκδ.)

Dong Xiang. Handling the pin overhead problem of DFTs for high-quality and at-speed tests. IEEE Transactions on computer-aided design of integrated circuits and systems.

Παραπομπή σε μορφή Chicago (17η εκδ.)

Dong Xiang. "Handling the Pin Overhead Problem of DFTs for High-quality and At-speed Tests." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems .

Παραπομπή σε μορφή MLA (9th εκδ.)

Dong Xiang. "Handling the Pin Overhead Problem of DFTs for High-quality and At-speed Tests." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems, .