Dong Xiang. Handling the pin overhead problem of DFTs for high-quality and at-speed tests. IEEE Transactions on computer-aided design of integrated circuits and systems.
Цитирование в стиле Чикаго (17-е изд.)Dong Xiang. "Handling the Pin Overhead Problem of DFTs for High-quality and At-speed Tests." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems .
Цитирование MLA (9-е изд.)Dong Xiang. "Handling the Pin Overhead Problem of DFTs for High-quality and At-speed Tests." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems, .
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