Dong Xiang. Handling the pin overhead problem of DFTs for high-quality and at-speed tests. IEEE Transactions on computer-aided design of integrated circuits and systems.
Chicago Style (17th ed.) CitationDong Xiang. "Handling the Pin Overhead Problem of DFTs for High-quality and At-speed Tests." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems .
MLA (9th ed.) CitationDong Xiang. "Handling the Pin Overhead Problem of DFTs for High-quality and At-speed Tests." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems, .
Warning: These citations may not always be 100% accurate.