Dong Xiang. Handling the pin overhead problem of DFTs for high-quality and at-speed tests. IEEE Transactions on computer-aided design of integrated circuits and systems.
Citazione stile Chigago Style (17a edizione)Dong Xiang. "Handling the Pin Overhead Problem of DFTs for High-quality and At-speed Tests." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems .
Citatione MLA (9a ed.)Dong Xiang. "Handling the Pin Overhead Problem of DFTs for High-quality and At-speed Tests." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems, .
Attenzione: Queste citazioni potrebbero non essere precise al 100%.