APA (7. basım) Alıntı

Pomeranz, I. On the use of random limited-scan to improve at-speed random pattern testing of scan circuits. IEEE Transactions on computer-aided design of integrated circuits and systems.

Chicago Style (17. basım) Atıf

Pomeranz, I. "On the Use of Random Limited-scan to Improve At-speed Random Pattern Testing of Scan Circuits." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems .

MLA (9th ed.) Atıf

Pomeranz, I. "On the Use of Random Limited-scan to Improve At-speed Random Pattern Testing of Scan Circuits." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems, .