Pomeranz, I. On the use of random limited-scan to improve at-speed random pattern testing of scan circuits. IEEE Transactions on computer-aided design of integrated circuits and systems.
Chicagoスタイル(17版)引用形式Pomeranz, I. "On the Use of Random Limited-scan to Improve At-speed Random Pattern Testing of Scan Circuits." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems .
MLA(9版)引用形式Pomeranz, I. "On the Use of Random Limited-scan to Improve At-speed Random Pattern Testing of Scan Circuits." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems, .
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