On the use of random limited-scan to improve at-speed random pattern testing of scan circuits.

On the use of random limited-scan to improve at-speed random pattern testing of scan circuits.

A method is proposed for improving the fault coverage that can be achieved by random patterns for circuits with scan. Under the test application scheme considered, primary input sequences are applied at-speed between scan operations. The proposed method uses limited scan operations to improve the fa...

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Bibliographic Details
Published in:IEEE Transactions on computer-aided design of integrated circuits and systems 21, 9 (2002).
Main Author: Pomeranz, I.
Format: Article
Language:English
Subjects:
At-speed random pattern testing.
Benchmark circuits.
Circuit state.
Complete test set.
Detectable circuit faults.
Fault coverage.
Primary input sequences.
Random limited-scan.
Random pattern generator.
Scan circuits.
Scan operations.
Sequential circuit.
Test application scheme.