Test vector generation for charge sharing failures in dynamic logic.
Dynamic logic is increasingly becoming a logic type of choice for designs requiring high speed and low area. Charge sharing is one of many problems that may cause failure in dynamic logic circuits due to their low noise immunity. The authors address the charge-sharing noise issue. Specifically, they...
| 出版年: | IEEE Transactions on computer-aided design of integrated circuits and systems 21, 12 (2002). |
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| 第一著者: | |
| フォーマット: | 論文 |
| 言語: | English |
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