A framework for testing special-purpose memories.
Current memory testing methods rely on fault models that are inadequate to accurately represent potential defects that occur in modern, often specialized, memories. To remedy this, the authors present a formal framework for modeling and testing special-purpose memories. Their approach uses three mod...
| Publicado no: | IEEE Transactions on computer-aided design of integrated circuits and systems 21, 12 (2002). |
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| Autor principal: | |
| Formato: | Artigo |
| Idioma: | English |
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