SPIRIT a highly robust combinational test generation algorithm.

SPIRIT a highly robust combinational test generation algorithm.

In this paper, an efficient test pattern generation (TPG) algorithm for combinational circuits based on the Boolean satisfiability method (SAT) is presented. The authors propose a new data structure for the complete implication graph that increases the precision of implication process. Next, they ex...

詳細記述

書誌詳細
出版年:IEEE Transactions on computer-aided design of integrated circuits and systems 21, 12 (2002).
第一著者: Gizdarski, E.
フォーマット: 論文
言語:English
主題:
Boolean satisfiability.
SPIRIT.
Backward justification.
Combinational circuit.
Data structure.
Dynamic learning.
Implication graph.
Redundancy identification.
Single path-oriented propagation.
Single-cone processing.
Static learning.
Test pattern generation algorithm.