Pomeranz, I. Test enrichment for path delay faults using multiple sets of target faults. IEEE Transactions on computer-aided design of integrated circuits and systems.
Citazione stile Chigago Style (17a edizione)Pomeranz, I. "Test Enrichment for Path Delay Faults Using Multiple Sets of Target Faults." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems .
Citatione MLA (9a ed.)Pomeranz, I. "Test Enrichment for Path Delay Faults Using Multiple Sets of Target Faults." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems, .
Attenzione: Queste citazioni potrebbero non essere precise al 100%.