APA ציטוט

Pomeranz, I. Test enrichment for path delay faults using multiple sets of target faults. IEEE Transactions on computer-aided design of integrated circuits and systems.

Chicago Style (17th ed.) Citation

Pomeranz, I. "Test Enrichment for Path Delay Faults Using Multiple Sets of Target Faults." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems .

ציטוט MLA

Pomeranz, I. "Test Enrichment for Path Delay Faults Using Multiple Sets of Target Faults." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems, .