Test enrichment for path delay faults using multiple sets of target faults.
Test sets for path delay faults in circuits with large numbers of paths are typically generated for path delay faults associated with the longest circuit paths. It is shown that such test sets may not detect faults associated with the next-to-longest paths. This may lead to undetected failures since...
| Published in: | IEEE Transactions on computer-aided design of integrated circuits and systems 22, 1 (2003). |
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| Main Author: | |
| Format: | Article |
| Language: | English |
| Subjects: |