Static electromigration analysis for on-chip signal interconnects.
With the increase in current densities, electromigration has become a critical concern in high-performance designs. Typically, electromigration has involved the process of time-domain simulation of drivers and interconnect to obtain average, root mean square (r.m.s.), and peak current values for eac...
| הוצא לאור ב: | IEEE Transactions on computer-aided design of integrated circuits and systems 22, 1 (2003). |
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| מחבר ראשי: | |
| פורמט: | Article |
| שפה: | English |
| נושאים: |