Power supply transient signal analysis for defect-oriented test.

Transient signal analysis (TSA) is a testing method that is based on the analysis of a set of VDD transient waveforms measured simultaneously at each supply port. Defect detection is performed by applying linear regression analysis to the time or frequency domain representations of these signals. C...

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Publicado en:	IEEE Transactions on computer-aided design of integrated circuits and systems 22, 3 (2003).
Autor principal:	Plusquellic, J.
Formato:	Artículo
Lenguaje:	English
Materias:	IDDT testing. Cross-correlation profile. Defect-oriented test. Delay fault detection. Frequency domain representations. Linear regression analysis. Power port measurements. Power supply transient signal analysis. Testing method. Time domain representations. Transient waveforms.