Reverse-order-restoration-based static test compaction for synchronous sequential circuits.
We present a new static test sequence compaction procedure called reverse-order-restoration (ROR) for synchronous sequential circuits. It improves the efficiency of the basic vector restoration-based compaction procedure by reversing the order of the vectors in the original test sequence. This reduc...
| 出版年: | IEEE Transactions on computer-aided design of integrated circuits and systems 22, 3 (2003). |
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| 第一著者: | |
| フォーマット: | 論文 |
| 言語: | English |
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