Testing big chips becomes an internal affair.

Testing big chips becomes an internal affair.

With the advent of the so-called system on a chip, or superchip, telling whether a complex integrated circuit is free of manufacturing flaws has become more difficult than ever before. Few believe that any automatic test equipment (ATE) machine of known architecture will be able to test tomorrow...

全面介紹

書目詳細資料
發表在:IEEE spectrum 36, 4 (1999).
主要作者: Runyon, S.
格式: Article
語言:English
主題:
Automatic test equipment.
Automatic test pattern generation.
Built-in self test.
Design for testability.
Integrated circuit testing.
Internal scan design.
Superchip.
System-on-a-chip.