Testing big chips becomes an internal affair.

Testing big chips becomes an internal affair.

With the advent of the so-called system on a chip, or superchip, telling whether a complex integrated circuit is free of manufacturing flaws has become more difficult than ever before. Few believe that any automatic test equipment (ATE) machine of known architecture will be able to test tomorrow...

Полное описание

Библиографические подробности
Опубликовано в::IEEE spectrum 36, 4 (1999).
Главный автор: Runyon, S.
Формат: Статья
Язык:English
Предметы:
Automatic test equipment.
Automatic test pattern generation.
Built-in self test.
Design for testability.
Integrated circuit testing.
Internal scan design.
Superchip.
System-on-a-chip.