Testing big chips becomes an internal affair.

Testing big chips becomes an internal affair.

With the advent of the so-called system on a chip, or superchip, telling whether a complex integrated circuit is free of manufacturing flaws has become more difficult than ever before. Few believe that any automatic test equipment (ATE) machine of known architecture will be able to test tomorrow...

Cur síos iomlán

Sonraí bibleagrafaíochta
Foilsithe in:IEEE spectrum 36, 4 (1999).
Príomhchruthaitheoir: Runyon, S.
Formáid: Alt
Teanga:English
Ábhair:
Automatic test equipment.
Automatic test pattern generation.
Built-in self test.
Design for testability.
Integrated circuit testing.
Internal scan design.
Superchip.
System-on-a-chip.